Presentation titled “Layout Standardisation Proposal to realise fully automated Silicon Photonics Wafer Test” to be discussed 20th – 21st Oct 2020

Singapore, 7 Oct 2020 – CompoundTek has been invited to present in the International Electrotechnical Commission (IEC) 2020 SC 86C technical committee meeting to be held 20^th and 21^st Oct. Founded in 1906, IEC is the world’s leading organisation for the preparation and publication of International Standards for all electrical, electronic and related technologies. These are known collectively as “electrotechnology”. IEC provides a platform to companies, industries and governments for meeting, discussing and developing the International Standards they require.

The SC86C sub-committee covers the preparation of international standards for fibre optic systems and active devices embracing all types of communications and sensor applications. This includes terminology, characteristics, test and measurement methods and functional interfaces including all mechanical, environmental, optical, and electrical requirements to ensure interoperability and reliable system performance.

CompoundTek Director of SIPh Test, (Dr) S.L.Tan will be talking about “Layout Standardisation Proposal to realise fully automated Silicon Photonics Wafer Test”. During the presentation, he will be discussing the motivation and importance of creating a set of layout rules to achieve efficient, fully automated test which will greatly drive down test turnaround time and costs – further accelerating industry’s adoption of SiPh wafer level test. 

Since its launch in 2017, Singapore-based CompoundTek has more than 20 global commercial customers in over 9 countries and over 20 leading Research Institutes and Universities in various applications such as telecommunications, automotive LiDAR, data communications, bio-sensing/bio-medical, artificial intelligence (AI), quantum computing and smart sensors.

For more information, please contact enquiries@compoundtek.com