CompoundTek’s proprietary test executive launched recently to great fanfare has been developed in response to an oft sought capability for a competitive advantage in the area of Silicon Photonics (SiPh) wafer testing. Designed to transform tests from a semi-automated to a fully automated system with minimum human intervention, it additionally incorporates AI and machine learning capabilities.

This technical paper begins by discussing findings of the test executive system after being put through its paces, proving to be able to reduce total test time for SiPh wafer by up to 40%.

The Modulator, while a critical component of a SiPh product, is likely the most complicated to test. Forming a major roadblock to full automated testing, this paper, a combined effort of Nanyang Technological University School of Electrical and Electronics Engineering Department and CompoundTek, expounds the use of SciPy, and how it can address modulator test complications.

The SciPy is an open-source scientific computing library used by CompoundTek’s test team and has produced several positive indicators including efficiencies from a fully automated modulator test and SiPh wafer test capabilities.

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Read the full Technical Paper below: